Measurement and Improvement of Manufacturing Capacity (MIMAC) Designed Experiment Report

This document presents a methodology and the results of an 11-factor simulation experiment designed to measure the effects and interactions of major factors that cause a loss in fab efficiency. The dataset contained actual manufacturing data from semiconductor manufacturing facilities organized into a standard format. Each dataset contained the minimum information necessary to model a factor, including product routing and process times, rework routings, equipment availability, operator availability, and product starts. A lowand high-capacity setting were selected for the 11 modeled factors. Four factors were identified as consistently significant: downtime, yield, dispatch rule, and setup. This work was done under the Measurement and Improvement of Manufacturing Capacity (MIMAC) project and was designed to allow JESSI and SEMATECH member companies to conduct similar analyses using their own data.